2. 2004. 12, item, Sun, Chen, Gu, cost-effective scanning structure and testing application scheme, U.S. Pat. No.6,959,426, 2005125 October.
3. Xiang Dong, Sun, Li Kaiwei, Scanning detection method based on scanning forest, national invention patent, ZL02 15993 1.9, (August 2006)
4. Xiang Dong, Sun, Li Kaiwei, Scanning Chain with Fault-free Shielding Parity Test and Construction Method of Scanning Forest, National Invention Patent, 2004 10009678.2 (application date: 2004.10.5, authorization date: 2006.6438).
5. Xiang Dong, Sun, Chen, scanning self-test structure with weighted scanning strobe signal, 200510013820.9, June 2008, 6438+08.
6. Xiang Dong, Sun, Li Kaiwei, Building a two-stage scanning structure with low test power consumption, 2004 100888 1.3, June 2008.
7. Item, Sun, Chen, Scanning self-test structure and method using weighted scanning enable signal, U.S. Pat. No.7,526,696, April 2009.
8. Xiang Dong, Li Kaiwei, path delay fault test compression and device, national invention patent, ZL 200810056676.7,2010.20.
9. Xiangdong, Zhao Yang, a path delay fault simulation method and device, patent number: 200810057433.5,2010.9.
10, eastward, Zhao Yang, deterministic self-test data compression and device, 20081.005741.6,201.9.
Professor Xiang Dong has applied for 10 national invention patents so far.