The integrated circuit test stand is used for the test after the integrated circuit is packaged, and mainly comprises an upper cover plate and a base which are assembled with each other. A through hole is accommodated in the upper cover plate, and a plurality of test probes are arranged near the through hole for contacting the IC, and a test spring is accommodated in each test probe. At least one bearing seat is accommodated in the base, corresponding to the through hole of the upper cover plate, and used for bearing the integrated circuit to be tested. At least one bearing spring is arranged between the lower part of the bearing seat and the base, the distance between the through hole and the bearing seat is smaller than the thickness of the packaged integrated circuit, and the elastic coefficient of the bearing spring is greater than the sum of the elastic coefficients of a plurality of test springs.
Benefits of using IC test bench:
1) can prevent the IC to be tested from being crushed due to size mismatch when testing the test equipment.
2) Test failure caused by poor contact between the test equipment and the IC to be tested can be avoided.
3) Improve the test yield and reduce the manufacturing cost.
Hony Electronics, a manufacturer of high-quality integrated circuit test benches in China, developed and produced various test benches, aging benches, aging benches and test fixtures for functional verification of integrated circuits in 16, and was designated as a supplier by Fortune 500 companies. Its products have won many national invention patents and applicable new patents.