2) Han Xiaodong, Zhang Yuefei, Zhang Ze, methods and devices for in-situ mechanical properties testing and structural analysis of single nanowire.
3) Han Xiaodong, Yue Yonghai, Zhang Yuefei and Zhang Ze, transmission electron microscope slides for in-situ structural performance testing of nanomaterials.
4) Han Xiaodong, Yue Yonghai, Zhang Yuefei, Zhang Ze, transmission electron microscope nano-material stress testing network.
5) Han Xiaodong, Yue Yonghai, Zhang Ze, Device for testing properties of low-dimensional materials under stress.
6) Han Xiaodong, Yue Yonghai, Zhang Ze, Nano-material stretching device in scanning electron microscope driven by piezoelectric ceramic sheet.
7), diagenesis, Kelly, Zhang Ze,,,, Zhang Ting, Feng, used for phase change storage.
SiSbTe series phase change thin film materials for devices
8) Han Xiaodong, Zhang Yuefei, Mao Shengcheng, Zhang Ze, scanning electron microscope, electron backscattering diffraction in-situ stretching device and measuring method.
9) Han Xiaodong, Zheng Kun, Zhang Ze, transmission electron microscope in-situ tensile nanowire mechanical and electrical properties testing device.
10) Han Xiaodong, Zheng Kun, Zhang Ze, transmission electron microscope in-situ compression device for testing the mechanical and electrical properties of nanowires.
1 1) Han Xiaodong, Zhang Yuefei, Zhang Ze, in-situ stretching device and method of nanowires in scanning electron microscope.
12) Zhang Ze, Kelly, Liu Pan, Han Xiaodong, a transmission electron microscope electrical measurement network based on phase change materials.