What is patent examination and what are the types of patent substantive examination system?

Patent examination system refers to the system that the state patent administration department conducts examination in accordance with the provisions of the State Patent Law after accepting the patent application. Where it complies with the provisions of the Patent Law, a patent right shall be granted. There are three common patent examination systems: formal examination system, substantive examination system and deferred examination system. First, the formal review system is also called the "registration system". It mainly examines the application documents of patent applications and related procedures, file formats, payment of application fees and other formal conditions. After passing the examination, it shall be registered and granted a patent right. Formal examination system does not examine substantive conditions such as novelty, creativity and practicality of patent applications. The advantages of formal examination system are high speed of patent application examination and approval, low cost, and no need to set up a huge examination institution and a large number of documents; The defects are that the invention-creation value applied for patent is not clear, the quality of the approved patent cannot be guaranteed, and the granted patent right is unreliable, which is prone to disputes. Second, the substantive examination system is also called the "complete examination system". In the formal examination of the patent application, the novelty search of the invention and creation should also be carried out, and the examination report should be formed. The examination report system is superior to the registration system in that it can make the patent applicant or interested party clearly know whether the invention is novel, but it can't effectively prevent the invention lacking creativity from being granted a patent right. Third, the deferred review system is also known as the "early public request review system". That is, the patent office does not immediately conduct substantive examination after formal examination of the patent application, but makes the application public first, and the applicant can request substantive examination at any time within the statutory time limit from the date of application. After the applicant makes a request for substantive examination, the Patent Office will conduct substantive examination only after the request is made public. If the applicant fails to make a request for substantive examination within the statutory time limit, it shall be deemed as automatic withdrawal of the application.