2. Invention patents: Han Xiaodong, Zhang Yuefei and Zhang Ze. Method and device for in-situ mechanical property testing and structural analysis of single nanowire, patent number: ZL 2006 10057989.5.
3. Invention patents: Han Xiaodong, Zhang Yuefei and Zhang Ze. Device and method for in-situ stretching nanowires by scanning electron microscope, patent number: ZL 2006 10 169839.3.
4. Invention patents: Han Xiaodong, Zhang Yuefei, Mao Shengcheng, Zhang Ze. In-situ stretching device and measuring method for electron backscattering diffraction of scanning electron microscope, patent number: ZL 2007 10 176364.5.
5. Invention patents: Han Xiaodong, Yue Yonghai, Zhang Yuefei, Zhang Ze. A transmission electron microscope slide for in-situ structural performance testing of nano materials, patent number: ZL2007 10 122092.0.
6. Invention patents: Han Xiaodong, Yue Yonghai, Zheng Kun, Zhang Yuefei, Zhang Ze. Nano-material stretching device in scanning electron microscope driven by piezoelectric ceramic sheet, patent number: ZL2008 10056837.2.
7. Invention patents: Han Xiaodong, Yue Yonghai, Zhang Yuefei, Zhang Ze. Transmission electron microscope nano-material stress testing carrier, patent number: ZL2008 10056836.8.
8. Invention patents: Han Xiaodong, Liu Pan, Zhang Yuefei, Yue Yonghai, Zhang Ze. Device for measuring electromechanical properties and microstructure of nano-materials under stress, patent number: ZL200820 124520.3.
9. Invention patent: Liu Pan, Deng, Zhang Ze, nonmagnetic bimetallic driver for transmission electron microscope, patent number: ZL 2005438+00973+0.
10. Invention patent: Zhang Yuefei. The invention relates to a method for preparing a flexographic ceramic net roller, and the patent number is ZL201010123371.0.
1 1. Invention patents: Han Xiaodong, Yue Yonghai, Zhang Yuefei, Zhang Ze. A nano-indentation system based on scanning electron microscope, patent number: ZL 201010142310.9.
12. Invention patents: Han Xiaodong, Yue Yonghai, Zhang Yuefei, Liu Pan, Zheng Kun, Zhang Ze. Transmission electron microscope in-situ force and electrical properties comprehensive test sample bar, patent number: ZL 20110145305.8.
13. American invention patents: Han, Xie Dade, Liu, Zhang Yongfeng, Zhang, Zhang, Zhang, device and method for measuring electromechanical properties and microstructure of nano-materials under stress. PatentNo. US8,069,733b2.
14. American invention patents: Han Xiaodong, Yue, Yang Haihui, Zhang Yufeng, Ping Liu, Zheng, Wang, Wang Xiaodong, Zhang, Zhang, dual-tilt transmission electron microscope sample holder for in-situ measurement of microstructure, patent number US 8,569,714b2.