The research objects of atomic force microscope can be organic solids, polymers, biological macromolecules and so on. There are a wide range of carriers for samples, including mica, glass, graphite, polished silicon wafer, silicon dioxide and some biofilms, among which newly stripped mica is the most commonly used, mainly because it is very flat and easy to handle. For polishing the silicon wafer, it is best to use a 7∶3 mixture of concentrated sulfuric acid and 30% hydrogen peroxide to cook at 90℃ for 65438+/-0h. Electrical performance testing requires a carrier with good conductivity, such as graphite or metal-plated substrate.
The maximum thickness of the sample, including the thickness of the sample table, is 10 mm. If the sample is too heavy, it will sometimes affect the action of the scanner. Please don't let the heavy samples go. The size of the sample is not greater than the size of the sample table (diameter 20 mm). It doesn't matter if it is a little bigger, but the maximum value is about 40 mm If the measurement is not fixed properly, it may lead to displacement. Please fix it before measurement.