First, the research topic analysis
Integrated circuit is a semiconductor manufacturing process, in which many transistors, resistors, capacitors and other components are fabricated on a small single crystal silicon wafer, and these components are combined into a complete electronic circuit according to the method of multilayer wiring or tunnel wiring. It is represented by the letter "IC" in the circuit (also represented by the symbol "n" and so on. ).
Since 1958, the first IC in the world came out, especially in the last 20 years, a generation of products came out almost every 2-3 years. Up to now, the products have developed from the initial small-scale integrated circuits to today's very large-scale integrated circuits. Integrated circuit design, integrated circuit manufacturing, integrated circuit packaging and integrated circuit testing have become four independent and interrelated industries in microelectronics industry. Microelectronics has become the forerunner and foundation of the development of various cutting-edge technologies and emerging industries in the world today. With the advanced development of microelectronics technology, we can promote the progress of other cutting-edge technologies more effectively. With the increasing integration and complexity of integrated circuits, pollution control, environmental protection and electrostatic protection technologies are becoming more and more blind or restricting the development of microelectronics technology. At the same time, with the sustained and steady growth of China's national economy and the continuous innovation and development of production technology, the requirements of production technology for production environment are getting higher and higher. Before and after the production of large-scale and ultra-large-scale integrated circuits, each process puts forward higher requirements for the production environment, not only to maintain a certain temperature, humidity and cleanliness, but also to pay enough attention to electrostatic protection.
A substance with an electrical conductivity between a conductor and an insulator is called a semiconductor. Semiconductor material is an electronic material with semiconductor properties, which can be used to make semiconductor devices and integrate electricity. Its conductivity ranges from 10 (U-3) to 10 (U-9) ohm/cm. The electrical properties of semiconductor materials are very sensitive to the changes of external factors such as light, heat, electricity and magnetism, and the conductivity of such materials can be controlled by doping a small amount of impurities in semiconductor materials. Multifunctional semiconductor devices are manufactured by using these characteristics of semiconductor materials.
With the rapid development of science and technology, the development of integrated circuits and semiconductors is also very rapid, which not only puts higher requirements on semiconductors and integrated circuits themselves, but also puts higher requirements on their production environment. And because of the development of science and technology, people's previous knowledge will also change. Therefore, it is necessary to fully grasp this knowledge and its development trend in the world. This topic is mainly to understand some knowledge and research about integrated circuit environment and semiconductor devices.
Second, formulate retrieval strategies.
1, select the retrieval method.
The retrieval method of this subject is mainly computer retrieval, and manual retrieval is combined with computer retrieval.
2. Select the retrieval tool.
If we want to find the literature of "integrated circuit environment and semiconductor devices", we must choose a suitable retrieval tool. According to the requirements of the subject and the literature sources collected by retrieval tools, this topic chooses comprehensive retrieval tools and databases, as well as integrated circuit professional retrieval tools and databases. The following retrieval tools and databases are specially selected:
(1) National Newspaper Index
(2) National New Bibliography
(3) Number of China countries.
(4) China Patent Index.
(5) Engineering indicators
(6) China hownet periodical full-text database.
(7) Wanfang Data Resource System
(8) Superstar Digital Library
(9) Full-text database of China sci-tech periodicals.
(10) China Academic Conference Papers Database
(1 1) China dissertation database
(12) China patent database
(13) Website of China National Intellectual Property Administration, People's Republic of China
(14) Project Village 2 Database
(15) Dutch Elsevier full-text database
(16) European patent database
3. Select the retrieval method
In order to obtain the research situation at home and abroad in recent years, this topic chooses the method of combining forward search and backward search.
4. Select the retrieval method
This topic can be searched by classification and topic.
(1) classification method
From the analysis of subjects, we can know that the classification of undergraduate subjects belongs to industrial technology. According to the category setting of China Library Classification, you can choose the following classification numbers as search items:
TN4 integrated circuit
TN3 semiconductor technology
TN36 semiconductor photoelectric device
TN37 semiconductor thermoelectric device, thermistor
(2) Thematic method
According to the analysis of the topic, you can choose the following keywords as the search entry:
Chinese keywords: integrated circuit; Environment; Semiconductor devices; Semiconductor integrated circuit (SCIC)
English keywords: integrated circuit; ; Conditions; Semiconductor devices;
5. Construct a retrieval type.
In the computer retrieval system, the operation mode of each retrieval word is determined by the logical collocation relationship. You can choose the following logical operations to formulate a retrieval strategy for retrieving this topic:
(integrated circuits and environment) or semiconductor devices
(integrated circuits and conditions) or semiconductor devices
Thirdly, experimental retrieval.
Experimental retrieval using CNKI full-text database.
Open CNKI full-text database, select advanced retrieval, select all database ranges, select 1990 to 2006 as the database time range, and sort them according to the collection time order. Select the search field to search in the title/keyword/abstract of the article. Enter "integrated circuit", "environment" and "semiconductor device" in the retrieval dialog box respectively.
The logical operation relationship between search words is "and" first, "and" or "second" Click the "Search" button to get the search results. Read the detailed information of hit literature, which meets the requirements of retrieval subject.
Fourth, official search.
According to the selected retrieval method, the retrieval is carried out in the selected retrieval tool and database respectively.
The retrieval of this topic can search related literature at home and abroad according to the type of literature.
1. Retrieval of domestic periodical papers
If you want to find relevant domestic periodical papers, you can choose retrieval tools and databases such as national newspaper index, CNKI periodical full-text database, China sci-tech periodical full-text database and Wanfang data resource system digital periodical.
(1) retrieval tool: Take the national newspaper index (natural science and technology edition) in 2000 as an example.
According to the classification number "TN4: Microelectronics, Integrated Circuits", we found 1 articles that meet the requirements from the seventh issue of National Newspaper Index in 2004;
0007 12565 Electrostatic Protection in Microelectronics Environment Wang Zeheng (changchun university of science and technology) Modern Information -2000, (2). -59-60
Then search one by one according to the classification number "TN3: Semiconductor Technology" and find three articles that meet the requirements:
0008 1 1849 Study on the Influencing Factors of Wang Jianwen Moisture Resistance of Zinc Oxide Varistor (Shaanxi xi 'an Radio No.2 Factory); Deng; Yang Ming et al. Sensor Technology -2000,19 (2).-13-16.
0008 1 1877 high temperature superconducting multi-chip module Du (University of Electronic Science and Technology of China); Yang Bangchao Electronic Components and Materials -2000, 19 (2). -22-23,33
The radiation recovery characteristics of CMOS/SOP anti-nuclear reinforcement circuit are king; Yao da; Su Xiudi et al. Journal of Natural Science of Jilin University-1999, (3) -72-74
The retrieval result of retrieval tool is title or abstract. In order to obtain the full text of the hit document, it is necessary to obtain the full text of the document according to the document source provided in the retrieval results.
(2) Computer retrieval takes CNKI periodical full-text database as an example.
Enter CNKI periodical full-text database, select advanced search, enter semiconductor, integrated circuit and environment in two search dialog boxes respectively, and select a topic in the drop-down menu of search field. Click the search button to get the search results. After reading the search results. , analysis, meet the requirements of the topic. The full text of abbreviated results can be printed and downloaded. The summary description format of 1 hit document is listed.
Advanced semiconductor silicon: an important basis for optimizing the performance of nano-integrated circuits
Dosimeter based on radiation effect of siics.
Author Zhang Qingxiang; Hou Mingdong; Zhen Honglou;
British writer Zhang Qingxiang; Houmingdong; Building (Institute of Modern Physics; China Academy of Sciences; Lanzhou City, Gansu Province; China);
Author: Institute of Modern Physics, Chinese Academy of Sciences; Lanzhou, Gansu;
Nuclear electronics and Detection Technology, nuclear electronics &; Detection technology, editorial office mailbox, 04, 2002
Journal honor: summary of the main contents of Chinese core journals: CJFD, the source journal of ASPT.
Semiconductor devices; Radiation effect; Total dose effect; Single event effect; Space environment detection;
Semiconductor detector; Radiation effect; Total dose effect; Single event effect; Space radiation environment;
Space radiation environment can cause total dose effect, single event effect and other radiation effects of semiconductor integrated circuits, and can be used to monitor space radiation environment. Under certain conditions, the detector based on this principle has advantages that the traditional surface barrier detector and PIN detector do not have. It is especially suitable for charged ion detection in spacecraft cabin and personal radiation dose detection in aerospace medicine. Three kinds of detectors based on radiation effect of semiconductor devices are introduced.
Radiation effects in space integrated circuits, such as total dose effect and single event effect, can be used to measure space radiation environment. Compared with traditional semiconductor detectors (barrier detectors and P-I-N diodes), detectors based on these effects have some advantages as dose depth monitors in spacecraft and "skin" dosimeters for personnel. This paper introduces three kinds of detectors and their applications in space.
National Natural Science Foundation of China (19775 0 5 8,10075064); ; Major Project of China Academy of Sciences in the Ninth Five-Year Plan (KJ95 2-SI-4 2 3)
DOI CNKI:ISSN:0258-0934 . 0 . 2002-04-025
2. Retrieval of related standards and patents in this topic.
If you want to find the relevant standards and patents of this topic, you can choose China patent index, standard retrieval tools and other book retrieval tools, as well as Wanfang data resource system mirror station, People's Republic of China (PRC) website, China National Intellectual Property Administration, China patent database, etc. Taking China patent index (manual), Wanfang data resource system and Springer and other related databases (computers) as examples, this paper lists some hit documents and their brief formats.
[1]. Manual search results:
International patent classification number authorization announcement number patent number
Patent holder's utility model/invention name
h 0 1L 23/48 cn 220 1727y ZL 9424 1608.2
Southeast University Ceramic Packaged Semiconductor Surge-proof Devices
h 0 1L 29/74 cn 2 196820y ZL 94204295.6
Xu Zhengshan can turn off SCR.
h 0 1L 23/40 cn 1029056 c ZL 93 108095.9
Cooling device for electronic equipment of Hitachi Company
h 0 1L 49/00 cn 1027607 c ZL 9 1 108927.6
Yunnan University High Sensitivity Semiconductor Gas Sensor
h 0 1L 29/784 cn 1098227 a ZL 94 104088.7
Semiconductor device of Semiconductor Energy Research Institute Co., Ltd. and its manufacturing method
Standard name standard number
Power semiconductor radiator GB 8446. 1-87
Semiconductor direct DC converter GB 7677-87
[2]. Computer search results:
Patent name: semi-chip semiconductor piezoelectric device structure and electroacoustic charge transfer device
Patent holder: Freescale Semiconductor Company.
ApplicationNo.: 028 14687.5
Patent Name: Semiconductor Light-emitting Device
Patent holder: Sharp Corporation.
Application number: 2004 10082 163.5.
Patent Name: Semiconductor Integrated Circuit Device
Patent holder: Elpida Memory Co., Ltd.; Hitachi ULSI system
ApplicationNo.: 2004 10 100687.2
Standard name: semiconductor device naming system
Standard number: ansi/EIA-370-13-1992
Standard name: the number of the terminal function of the semiconductor device with the same name and the unit name of the multi-unit semiconductor device.
Standard number: ansi/EIA-321-c-1987.
Standard name: mechanical standardization of semiconductor devices, dimensions
Standard number: IEC 60191-2-1992.
3, domestic academic conferences, dissertations, scientific and technological achievements and other information retrieval.
If you want to find information about domestic academic conferences, dissertations, scientific and technological achievements, you can choose book retrieval tools such as China Academic Conference Document Bulletin and China Academic Papers Bulletin, as well as China Academic Conference Papers Database, China Academic Dissertation Database, China Scientific and Technological Achievements Database and China Patent Database of Wanfang Data Resource System. Taking the retrieval results of China academic conference papers database of Wanfang data resource system as an example, this paper lists the description format of 1 hit documents.
Design of Distributed Simulation System for Semiconductor Devices
Author Zhang Bin;
Tutor Yan Yonghong;
Degree awarding unit Hunan University;
Microelectronics and solid-state electronics
Degree in 2003
Master thesis level
Online publishing contributor Hunan University
Submission time of online publication: July 2, 20031
Semiconductor device simulation; Distributed; Parallel simulation; Numerical analysis; Middleware;
Semiconductor device simulation; Distribution; Parallel computing; Numerical analysis; Intermediate vessel;
The development status of semiconductor device simulation software is summarized, the model of semiconductor device is analyzed, the basic methods and typical processes of semiconductor device simulation are studied, the requirements of semiconductor device development and the comparison of several device simulation calculation methods are analyzed, and the necessity, feasibility and practical significance of distributed device parallel simulation system are also analyzed. The numerical simulation model of semiconductor devices and the basic equations of the model are described in detail, the unique boundary conditions and algorithm analysis of device numerical analysis are discussed, and the problems to be solved by device simulation software are explained in detail. The computer technology and functional module division of the device parallel simulation system are discussed, and the client program design, middleware design and server program design are realized in detail. Using it, the doping concentration distribution, electron and hole concentration simulation of the transistor are completed, and the input parameters are discussed, and the output of the calculation results is analyzed. On this basis, the one-dimensional steady-state analysis of the transistor is completed by using MATLAB5.3 numerical calculation tool, and the correctness of the system simulation results is verified. The application of semiconductor device simulation software in the development of new devices is briefly described, and the advantages of performance simulation expansion and process simulation integration are briefly described. Finally, the main work and innovation of distributed parallel simulation system are summarized systematically.
This paper summarizes the practicability of developing simulation software for semiconductor devices, develops the semiconductor device model, the basic methods and representative programs of semiconductor device simulation, and analyzes the increasing demand of semiconductor devices, the comparison of several simulation systems for semiconductor devices, and the necessity, feasibility and significance of parallel simulation of device distribution. Model of semiconductor device ...
CDMD: 10532.2.2003.0870
4. Foreign information retrieval
If you want to find foreign language materials related to this topic, you can choose Engineering Village 2 database, Elsevier full-text database in the Netherlands, European patent database and so on.
According to the retrieval strategies and methods discussed above, we can search with "semiconductor devices" in the selected database to obtain the required relevant information.
Now, two hit documents in Project Village 2 database are listed.
Method for measuring thermal resistance of pn junction semiconductor device
Janusz Alebsky and Krzysztof Goreki
Manual for measurement, processing and acceptance; 2006 1 1 online provided 2 1
Direct analysis method for extracting transient thermal parameters of semiconductor devices
F.N. Macana
M: Microelectronics and Reliability, in press, corrected proof, online 65438, 2006 1 1 4th.
Verb (abbreviation of verb) gets the original text and analyzes the retrieval results of the topic.
Through the above book retrieval tools and database retrieval, a lot of relevant information has been obtained. For the retrieval results of book retrieval tools and bibliographic and abstract databases, the original text should be obtained according to the literature sources provided by the retrieval results. For the retrieval results of full-text database, the original text can be obtained directly.
According to the content requirements of the subject, through the retrieval of the above process, the domestic and foreign literature collection of this research subject is relatively complete, which can meet the research needs of this subject.