Micro- and nano-scale films can be measured with the AF-3000 series film thickness measuring instrument;
The AF series has an accuracy of 0.1nm and can measure the film thickness of 10 layers. It also supports customization and can be used in multiple scenarios such as offline/online/Mapping.
The AF series adopts the principle of spectroscopic interference. From the measurement principle, it can only measure light-transmitting or semi-transparent films. Theoretically speaking, films of opaque materials such as metals and metalloid compounds can be measured. , cannot be detected.
But if the film is thin to a certain extent, the film of some materials will be translucent. At this time, the film thickness measuring instrument can measure the thickness of the metal film and the metalloid compound film. AF series We have also tested many films made of opaque materials, such as chromium, nickel, titanium, etc.
However, it is uncertain whether metal films and metal-like compound films of different materials and thicknesses are transparent to light of different wavelengths. The AF series uses deuterium lamps and tungsten halogen lamps. The maximum spectral wavelength covers 180nm~2400nm. If there is any opaque material film that needs to be tested, the AF series can also help with the test to see the feasibility.
If the film of opaque material does not fully cover the product, you can also use the AM-7000 series of white light interferometers for detection. The AM series has higher accuracy, up to 0.03nm.