The test category covers 26 items in 7 categories, including diodes, triodes (such as BJT, MOSFET, IGBT), protection devices, voltage stabilization integration, relays, optocouplers, sensing monitoring and many other electronic components.
The high voltage source is standard 1400V (2KV optional), and the high current source is standard 100A (40A, 200A, 500A optional).
The gate/gate voltage is 40V, and the gate current is 10mA.
The highest resolution is 1mV/ 1nA, and the highest accuracy is 0.5%.
The DCT2000 transistor parameter tester system is suitable for transistor test and junction capacitance test, and supports "pulse one-key heating" and "diaphragm connection".
Part I: Specifications &; environment
1. 1, product information
Product model: DCT2000
Product name: transistor parameter tester system
1.2, physical specifications
Main engine size: depth 660* width 430* height 2 10(mm)
Main engine weight: < < 35kg
1.3, electrical environment
Mainframe power consumption: < 300 w
Altitude: no more than 4000 meters above sea level; ;
Environmental requirements: -20℃ ~ 60℃ (storage) and 5℃ ~ 50℃ (working);
Relative humidity: 20% RH ~ 75% RH (no condensation, wet bulb thermometer temperature below 45℃);
Atmospheric pressure: 86 kpa ~106 kpa;
Protective conditions: no big dust, corrosive or explosive gas, conductive dust, etc.
Power grid requirements: AC220V, 10%, 50hz1Hz;
Working hours: continuous;
Part II: Application scenarios and product features.
First, the application scenario.
1, test analysis (initially tested in the design stage of R&D and power devices, the main function is curve tracker)
2. Failure analysis (test and analyze the failed devices to find out the failure mechanism. In order to put forward the improvement scheme for the overall design and use process of the electronic machine)
3. Selection and pairing (all devices are tested before soldering to the circuit board, and devices with relatively consistent test data are classified and paired).
4. Incoming materials inspection (Institute and Quality Department of Electronics Factory (IQC) conduct random inspection/full inspection of incoming devices to control the yield of devices).
5. Mass production test (it can be connected with various auxiliary mechanical equipment such as manipulator, code scanner and sorter to realize large-scale and automatic test).
6. Replace imported products (DCT2000 transistor parameter tester system can replace imported products of the same level)
Second, the product features
1, programmable high voltage source 10~ 1400V, 2000V optional;
2. Programmable large current source 1uA~ 100A, 40A, 200A and 500A are optional;
3. The driving voltage is 65438+ 100 mV ~ 40V.
4. Control the electrode current to be10ua ~10ma;
5. 16 bit ADC, 100K/S sampling rate;
6. Automatic identification of equipment polarity NPN/PNP
7. Curve tracker and four-wire Kelvin connection ensure the accuracy of load measurement.
8. Connect the calibration digital meter through RS232 interface to check the system.
9. Different packaging forms provide corresponding fixtures and adapters (such as TO220, SOP-8, DIP, SOT-23, etc.). ).
10, the transistor parameter tester system can measure many electronic components (such as diodes, triodes, MOSFET, IGBT, thyristors, optocouplers, relays, etc. );
1 1, transistor parameter tester system can realize curve tracker (such as breakdown voltage V(BR)CES/V(BR)DSs, leakage current ICEs/lGEs/IGSs/lDSs, threshold voltage /VGE(th), turn-on voltage /VCE(on), transconductance/gfe/.
12, junction capacitance parameters can also be tested, such as Cka, Ciss, Crss, Coss；;
13, pulse current automatic heating function, convenient for high temperature test, no need to plug in a heating device;
14, the Prober interface and Handler interface are optional (16Bin), and the efficiency of connecting the sorter is the highest1h/9000;
15, the transistor parameter tester system is widely used in IQC and laboratories of major electronic factories;
Part III: Product introduction
3. 1, product introduction
DCT2000 transistor parameter tester system is a new generation of "transistor parameter tester system" developed and designed by our technical team after years of experience in transistor parameter tester system and familiarity with many test system products at home and abroad. Both software and hardware are done by a team. This determines that the functionality and reliability of this product can be continuously improved and improved.
As for the output of pulse signal source in the transistor parameter tester system, the high voltage source is standard 1400V (2KV optional), the high current source is standard 100A (40A, 200A, 500A optional), the gate voltage is 40V, the gate current is 10mA, and the resolution is as high as1mv. Program-controlled software is written based on Lab VIEW platform to fill the menu interface. The test socket with Kelvin induction structure is used to automatically compensate any pressure drop caused by the inside of the system and the length of the test cable to ensure the accuracy and reliability of the test results. This product can test 26 kinds of electronic components in 7 categories, such as silicon, silicon carbide and gallium nitride, such as IGBTs, diode, MOSFETs, BJT, SCR and SCRs. It covers almost all common devices in electronic products. The voltage and current source and function configuration have strong expansibility.
The product is a desktop structure with a desktop, which consists of a test host and a program-controlled computer. Insert all kinds of fixtures and adapters, and connect the sorting machine and manipulator through the detector interface and processor interface (16Bin) to establish a workstation, so as to realize rapid batch testing. Through software setting, it can be automatically classified and stored according to the parameter level of the tested equipment. Able to deal with different scenarios such as incoming inspection, failure analysis, matching and mass production testing.
The reliability of transistor parameter tester system products, repeatability of test data and test efficiency have excellent performance. The innovative "point control fixture" allows the operator to realize single point measurement on the fixture. Simple operation and higher efficiency. Test data can be saved as EXCEL text, and curve tracking can be completed conveniently and quickly.
3.2. Man-machine interface (DCT2000 transistor parameter tester system)
Part IV: Function Configuration
4. 1, configuration options
The function configuration of DCT2000 transistor parameter tester system is as follows
4.2, adapter selection
The adapters of DCT2000 transistor parameter tester system are as follows
4.3, test types and parameters
The test types and parameters of DCT2000 transistor parameter tester system are as follows
(1) diode: diode? diode; the one who lacks dialectical thinking
Kelvin, Vrrm, Irrm, Vf, △Vf, △Vrrm, Cka, Tr (optional);
(2) Diode: Zener diode? ZD (zener diode)
Kelvin, Vz, lr, Vf, △Vf, △Vz, Roz, lzm, Cka.
(3) Diode: Zener diode? ZD (zener diode)
Kelvin, Vz, lr, Vf, △Vf, △Vz, Roz, lzm, Cka
(4) Diode: Schottky diode.
Kelvin, Type_ident, Pin_test, Vrrm, Irrm, Vf, △Vf, V_Vrrm, I_Irrm, △Vrrm, Cka, Tr (optional);
(5) Diodes: transient diodes? Television viewing system (abbreviation for television viewing systems)
Kelvin, Vrrm, Irrm, Vf, △Vf, △Vrrm, Cka
(6) Diodes: rectifier bridge stack
Kelvin, Vrrm, Irrm, Ir_ac, Vf, △Vf, △Vrrm, Cka
(7) Diode: three-phase rectifier bridge stack.
Kelvin, Vrrm, Irrm, Ir_ac, Vf, △Vf, △Vrrm, Cka
(8) Triode: Triode
Kelvin, Type_ident, Pin_chk, V(br)cbo, V(br)ceo, V(br)ebo, Icbo, lceo, Iebo, Hfe, Vce(sat), Vbe(sat), △Vsat, △Bvceo, △Bvcbo, △
(9)? Triode class: bidirectional thyristor
Kelvin, Type_ident, Qs_chk, Pin_test, Igt, Vgt, Vtm, Vdrm, Vrrm, Vdrm rrm, Irrm, Idrm, Irrm_drm, Ih, IL, C_vtm, △Vdrm, △Vrrm, △ VTM;
(10) triode class: unidirectional thyristor.
Kelvin, Type_ident, Qs_chk, pin test, lgt, Vgt, Vtm, Vdrm Vrrm, IH, IL, △Vdrm△Vrrm, VTM;
(1 1) triode class: MOSFET.
Kelvin, Type_ident, Pin_test, VGS(th), V(BR)Dss, Rds(on), Bvds_rz, △Bvds, Gfs, Igss, ldss, Idss zero, Vds(on), Vsd, Ciss, Coss, Crss, BVSS.
(12) triode class: double MOSFET
Kelvin, Pin_chk, Ic_fx_chk, Type_ident, Vgs 1(th), VGs2(th), VBR)Dss 1, VBR)Dss2, Rds 1(on), Rds2(on).
(13) triode class: JFET
Kelvin, VGS(off), V(BR)Dss, Rds(on), Bvds_rz, Gfs, lgss, Idss(off), Idss(on), vds(on), Vsd, Ciss, Crss, Coss.
(14) triode class: IGBT
Kelvin, VGE(th), V(BR)CES, Vce(on), Gfe, lges, lces, Vf, Ciss, Coss, Crss.
(15) triode class: three-terminal switching power supply driver
Kelvin、Vbb(AZ)、Von(CL)、Rson、Ibb(off)、Il(lim)、Coss、Fun _ pin _ volt
(16) triode class: seven-terminal half-bridge driver.
Kelvin, lvs (off), lvs (on), SON _ H, SON _ L, lin, Iinh, ls_Volt, Sr _ volt.
(17) triode class: high-end power switch
Kelvin、Vbb(AZ)、Von(CL)、Rson、Ibb(off)、ll(Iim)、Coss、Fun _ pin _ volt
(18) protection category: varistor
Kelvin, Vrrm, Vdrm, Irrm, Idrm, Cka, △ VR;
(19) protection category: single group voltage protector.
Kelvin, Vrrm, Vdrm, Irrm, Idrm, Cka, △ VR;
(20) Protection category: two sets of voltage protectors.
Kelvin, Vrrm, Vdrm, Irrm, Idrm, Cka, △ VR;
(2 1) voltage regulator integration class: three-terminal voltage regulator.
Kelvin, Type_ident, Treg_ix_chk, Vout, Reg_Line, Reg_Load, IB, IB_I, Roz, △IB, VD, ISC, Max_lo, Ro, Ext _Sw, Ic _ fx _ chk.
(22) voltage stabilization integration class: refer to IC(TL43 1)
Kelvin, Vref, △Vref, lref, Imin, loff, Zka, Vka.
(23) Voltage stabilization integration class: four-terminal voltage stabilization.
Kelvin, Type_ident, Treg_ix_chk, Vout, Reg_Line, Reg_Load, IB, IB_I, Roz, △lB, VD, Isc, Max_lo, Ro, Ext_Sw, Ic _ fx _ chk.
(24) Voltage stabilizing integration class: switching voltage stabilizing integrator.
Matching;
(25) Relay: 4-pin unipolar single group, 5-pin unipolar double group, 8-pin bipolar double group, 8-pin bipolar quadrupole, solid-state relay.
Kelvin, Pin_chk, Dip6_type_ident, Vf, Ir, Vl, Il, Ift, Ron, Toff (optional);
(26) Optical coupler: 4-pin optical coupler, 6-pin optical coupler, 8-pin optical coupler and 16-pin optical coupler.
Kelvin, Pin_chk, Vf, Ir, Bvceo, Bveco, Iceo, Ctr, Vce(sat), tr, TF;
(27) Sensor monitoring category:
Current sensor (ACS7 12XX series, CSNR_ 15XX series) (optional);
Hall element (MT44XX series, A 12XX series) (optional);
Voltage monitor (optional);
Voltage reset IC (optional);
Curve tracker
Part V: Performance indicators
The performance indexes of DCT2000 transistor parameter tester system are as follows
5. 1, current/voltage source (VIS) with VI measuring unit.
(1) pressurization
The measuring range is 40V, the resolution is 19.5mV, the accuracy is 1%, and the set value is 10mV.
Range: 20V resolution 10mV accuracy 1% set value: 5mV.
Measuring range 10V resolution 5mV accuracy 1% set value 3mV
Measuring range 5V resolution 2MV accuracy 1% set value 2mV.
Measuring range 2v resolution 1mV accuracy 1% set value 2mV.
(2) Add traffic (FI)
Measuring range 40A Resolution 19.5mA Precision 2% Setting value 20mA
Measuring range 4A Resolution 1.95mA Precision 1% Set value 2mA
Measuring range 400mA Resolution 1 195uA Accuracy 1% Set value 200uA.
Measuring range 40mA resolution 1 19.5uA accuracy 1% set value 20uA.
Measuring range: 4mA resolution 195nA accuracy 1% set value: 200nA.
Measuring range 400uA Resolution 19.5nA Accuracy 1% Set value 20nA
Measuring range 40uA resolution 1.95nA accuracy 1% set value 2nA.
Description: When the current is greater than 1.5A, it will automatically output in pulse mode, and the pulse width range can be adjusted: 300us- 1000us.
(3) Current measurement (MI)
Measuring range 40A Resolution 1.22mA Precision 1% Reading 20mA
Measuring range 4A Resolution 122uA Accuracy 0.5% Reading 2mA
Measuring range 400mA resolution 12.2uA accuracy 0.5% reading 200uA
Measuring range 40mA Resolution 1.22uA Accuracy 0.5% Reading 20uA
Measuring range 4mA resolution 122nA accuracy 0.5% reading 2uA.
Measuring range 400uA Resolution 12.2nA Accuracy 0.5% Reading 200nA
Measuring range 40uA resolution 1.22nA accuracy 1% reading 20nA.
(4) Voltage measurement (millivolts)
Measuring range 40V resolution 1.22mV accuracy 1% reading 20mV.
Measuring range: 20V resolution 122uV accuracy: 0.5% reading: 2mV
Measuring range 10V resolution 12.2uV accuracy 0.5% reading 200uV
The measuring range is 5v, the resolution is 1.22uV, the accuracy is 0.5% and the reading is 20uV.
5.2. Data acquisition part
16-bit ADC, 100K/S sampling rate.
(1) voltage measurement (MV)
Measuring range 2000 v resolution 30.5mV accuracy 0.5% reading 200mV
Measuring range 1000 V resolution 15.3mV accuracy 0.2% reading 20mV.
Measuring range 100 V resolution 1.53mV accuracy 0. 1% reading 100 MV.
Measuring range 10V resolution 153uV accuracy 0. 1% reading 5mV.
Measuring range 1V resolution 15.3uV accuracy 0. 1% reading 2mV.
Measuring range 0. 1V resolution 1.53uV accuracy 0.2% reading 2mV.
(2) Leakage current measurement (MI)
Measuring range 100mA resolution 30uA accuracy 0.2% reading 100uA
Measuring range 10mA Resolution 3uA Accuracy 0. 1% Reading 3UA
Measuring range 1mA resolution 300nA accuracy 0. 1% reading 300 na
Measuring range 100uA resolution 30nA accuracy 0. 1% reading 100nA
Measuring range 10uA Resolution 3nA Accuracy 0. 1% Reading 20nA
Measuring range 1uA resolution 300pA accuracy 0.5% reading 5 na
Measuring range 100nA Resolution 30pA Accuracy 0.5% Reading 0.5nA
(3) Capacitance measurement (MC)
Measuring range 6nF resolution 10PF accuracy 5% reading 50PF
Measuring range 60nF resolution 100PF accuracy 5% reading 100 pf
5.3.HVS (basic) 12-bit digital-to-analog converter
(1) pressurization
Measuring range 2000V/ 10mA resolution 30.5mV accuracy 0.5% setting value 500mV.
Measuring range 200V/ 10mA resolution 30.5mV accuracy 0.2% set value 50mV.
The measuring range is 40V/50mA, and the resolution is 30. Accuracy 0. 1% set value 5mV
(2) add trafFIc (fi):
Measuring range 10mA resolution 3.8 1uA accuracy 0.5% set value 10uA
Measuring range 2mA Resolution 38 1nA Accuracy 0.5% Set value 2uA
The measuring range is 200uA, the resolution is 38. 1nA, the accuracy is 0.5%, and the set value is 200nA.
The measuring range is 20uA, the resolution is 3.8 1nA, the accuracy is 0.5%, and the set value is 20nA.
Measuring range 2uA Resolution 38 1pA Accuracy 0.5% Set value 20nA
The DCT2000 transistor parameter tester system can measure many electronic components (such as diodes, triodes, MOSFET, IGBT, thyristors, optocouplers, relays, etc.). ) and products are widely used in universities, packaging and testing factories and electronics factories. .....